Analysis of Negative Bias Temperature Instability in Body-Tied Low-Temperature Polycrystalline Silicon Thin-Film Transistors

标题
Analysis of Negative Bias Temperature Instability in Body-Tied Low-Temperature Polycrystalline Silicon Thin-Film Transistors
作者
关键词
-
出版物
IEEE ELECTRON DEVICE LETTERS
Volume 29, Issue 2, Pages 165-167
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2008-01-26
DOI
10.1109/led.2007.914083

向作者/读者发起求助以获取更多资源

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started