A Review of Data Mining with Big Data towards Its Applications in the Electronics Industry
出版年份 2018 全文链接
标题
A Review of Data Mining with Big Data towards Its Applications in the Electronics Industry
作者
关键词
-
出版物
Applied Sciences-Basel
Volume 8, Issue 4, Pages 582
出版商
MDPI AG
发表日期
2018-04-11
DOI
10.3390/app8040582
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Mutually-exclusive-and-collectively-exhaustive feature selection scheme
- (2018) Chia-Yen Lee et al. APPLIED SOFT COMPUTING
- A Bayesian network model for prediction of weather-related failures in railway turnout systems
- (2017) Guang Wang et al. EXPERT SYSTEMS WITH APPLICATIONS
- A framework for Big Data driven product lifecycle management
- (2017) Yingfeng Zhang et al. JOURNAL OF CLEANER PRODUCTION
- Identification of key features using topological data analysis for accurate prediction of manufacturing system outputs
- (2017) Wei Guo et al. JOURNAL OF MANUFACTURING SYSTEMS
- The current status of the consumer electronics repair industry in the U.S.: A survey-based study
- (2017) Mostafa Sabbaghi et al. RESOURCES CONSERVATION AND RECYCLING
- Big Data Analytics for Smart Manufacturing: Case Studies in Semiconductor Manufacturing
- (2017) et al. Processes
- Robust parameter design for the micro-BGA stencil printing process using a fuzzy logic-based Taguchi method
- (2016) Tsung-Nan Tsai et al. APPLIED SOFT COMPUTING
- Manufacturing intelligence for reducing false alarm of defect classification by integrating similarity matching approach in CMOS image sensor manufacturing
- (2016) Ying-Jen Chen et al. COMPUTERS & INDUSTRIAL ENGINEERING
- Big Data for supply chain management in the service and manufacturing sectors: Challenges, opportunities, and future perspectives
- (2016) Ray Y. Zhong et al. COMPUTERS & INDUSTRIAL ENGINEERING
- Big data analytics for forecasting cycle time in semiconductor wafer fabrication system
- (2016) Junliang Wang et al. INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
- Mining consumer experiences of repairing electronics: Product design insights and business lessons learned
- (2016) Ardeshir Raihanian Mashhadi et al. JOURNAL OF CLEANER PRODUCTION
- Similarity approach for reducing qualification tests of electronic components
- (2016) Stoyan Stoyanov et al. MICROELECTRONICS RELIABILITY
- A novel approach to hedge and compensate the critical dimension variation of the developed-and-etched circuit patterns for yield enhancement in semiconductor manufacturing
- (2015) Chen-Fu Chien et al. COMPUTERS & OPERATIONS RESEARCH
- Advanced Semiconductor Manufacturing Using Big Data
- (2015) Tomio Tsuda et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- Yield Prediction Through the Event Sequence Analysis of the Die Attach Process
- (2015) Hoyeop Lee et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- Big Data in product lifecycle management
- (2015) Jingran Li et al. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
- A Novel Forecasting Model Based on Support Vector Regression and Bat Meta-Heuristic (Bat–SVR): Case Study in Printed Circuit Board Industry
- (2015) Amirmohammad Tavakkoli et al. INTERNATIONAL JOURNAL OF INFORMATION TECHNOLOGY & DECISION MAKING
- An Efficient and Effective Fuzzy Collaborative Intelligence Approach for Cycle Time Estimation in Wafer Fabrication
- (2015) Toly Chen INTERNATIONAL JOURNAL OF INTELLIGENT SYSTEMS
- Analysing semiconductor manufacturing big data for root cause detection of excursion for yield enhancement
- (2015) Chen-Fu Chien et al. INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
- An investigation of used electronics return flows: A data-driven approach to capture and predict consumers storage and utilization behavior
- (2015) Mostafa Sabbaghi et al. WASTE MANAGEMENT
- Modeling and analyzing semiconductor yield with generalized linear mixed models
- (2014) D. C. Krueger et al. APPLIED STOCHASTIC MODELS IN BUSINESS AND INDUSTRY
- Fuzzy neural network-based rescheduling decision mechanism for semiconductor manufacturing
- (2014) J. Zhang et al. COMPUTERS IN INDUSTRY
- Data Mining for Optimizing IC Feature Designs to Enhance Overall Wafer Effectiveness
- (2014) Chen-Fu Chien et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- Data Mining for Significance in Yield-Defect Correlation Analysis
- (2014) Uwe Hessinger et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- A Framework for Root Cause Detection of Sub-Batch Processing System for Semiconductor Manufacturing Big Data Analytics
- (2014) Chen-Fu Chien et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- Data-intensive applications, challenges, techniques and technologies: A survey on Big Data
- (2014) C.L. Philip Chen et al. INFORMATION SCIENCES
- A data mining approach for analyzing semiconductor MES and FDC data to enhance overall usage effectiveness (OUE)
- (2014) Chen-Fu Chien et al. International Journal of Computational Intelligence Systems
- An effective fuzzy collaborative forecasting approach for predicting the job cycle time in wafer fabrication
- (2013) Toly Chen COMPUTERS & INDUSTRIAL ENGINEERING
- Similarity Searching for Defective Wafer Bin Maps in Semiconductor Manufacturing
- (2013) Chung-Shou Liao et al. IEEE Transactions on Automation Science and Engineering
- A Unified Framework for Outlier Detection in Trace Data Analysis
- (2013) Zhiguo Li et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- A fuzzy rule for job dispatching in a wafer fabrication factory—a simulation study
- (2013) Toly Chen INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
- A system for online detection and classification of wafer bin map defect patterns for manufacturing intelligence
- (2013) Chen-Fu Chien et al. INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
- Product customization of tablet computers based on the information of online reviews by customers
- (2013) Simon Li et al. JOURNAL OF INTELLIGENT MANUFACTURING
- An empirical study of design-of-experiment data mining for yield-loss diagnosis for semiconductor manufacturing
- (2013) Chen-Fu Chien et al. JOURNAL OF INTELLIGENT MANUFACTURING
- A Fuzzy-Neural Ensemble and Geometric Rule Fusion Approach for Scheduling a Wafer Fabrication Factory
- (2013) Hsin-Chieh Wu et al. MATHEMATICAL PROBLEMS IN ENGINEERING
- An Iterative Procedure for Optimizing the Performance of the Fuzzy-Neural Job Cycle Time Estimation Approach in a Wafer Fabrication Factory
- (2013) Toly Chen et al. MATHEMATICAL PROBLEMS IN ENGINEERING
- Precise and Accurate Job Cycle Time Forecasting in a Wafer Fabrication Factory with a Fuzzy Data Mining Approach
- (2013) Toly Chen et al. MATHEMATICAL PROBLEMS IN ENGINEERING
- Thermal parameters optimization of a reflow soldering profile in printed circuit board assembly: A comparative study
- (2012) Tsung-Nan Tsai APPLIED SOFT COMPUTING
- Forecasting the yield of a semiconductor product with a collaborative intelligence approach
- (2012) Toly Chen APPLIED SOFT COMPUTING
- Study on shop floor control system in semiconductor fabrication by self-organizing map-based intelligent multi-controller
- (2012) Yeou-Ren Shiue et al. COMPUTERS & INDUSTRIAL ENGINEERING
- Data mining techniques and applications – A decade review from 2000 to 2011
- (2012) Shu-Hsien Liao et al. EXPERT SYSTEMS WITH APPLICATIONS
- Semiconductor fault detection and classification for yield enhancement and manufacturing intelligence
- (2012) Chen-Fu Chien et al. Flexible Services and Manufacturing Journal
- Data mining in education
- (2012) Cristobal Romero et al. Wiley Interdisciplinary Reviews-Data Mining and Knowledge Discovery
- Study of SOM-based intelligent multi-controller for real-time scheduling
- (2011) Yeou-Ren Shiue et al. APPLIED SOFT COMPUTING
- Applying the hybrid fuzzy c-means-back propagation network approach to forecast the effective cost per die of a semiconductor product
- (2011) Toly Chen COMPUTERS & INDUSTRIAL ENGINEERING
- Product development with data mining techniques: A case on design of digital camera
- (2011) Jae Kwon Bae et al. EXPERT SYSTEMS WITH APPLICATIONS
- A review of data mining applications for quality improvement in manufacturing industry
- (2011) Gülser Köksal et al. EXPERT SYSTEMS WITH APPLICATIONS
- Development of a soldering quality classifier system using a hybrid data mining approach
- (2011) Tsung-Nan Tsai EXPERT SYSTEMS WITH APPLICATIONS
- A data mining approach considering missing values for the optimization of semiconductor-manufacturing processes
- (2011) Doh-Soon Kwak et al. EXPERT SYSTEMS WITH APPLICATIONS
- Manufacturing intelligence for class prediction and rule generation to support human capital decisions for high-tech industries
- (2011) Li-Fei Chen et al. Flexible Services and Manufacturing Journal
- Getting More From the Semiconductor Test: Data Mining With Defect-Cluster Extraction
- (2011) Melanie Po-Leen Ooi et al. IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT
- Cycle-Time Key Factor Identification and Prediction in Semiconductor Manufacturing Using Machine Learning and Data Mining
- (2011) Yair Meidan et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- GA Guided Cluster Based Fuzzy Decision Tree for Reactive Ion Etching Modeling: A Data Mining Approach
- (2011) Sanjay Kumar Shukla et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- Discovering Correlated Parameters in Semiconductor Manufacturing Processes: A Data Mining Approach
- (2011) Alain Casali et al. IEEE TRANSACTIONS ON SEMICONDUCTOR MANUFACTURING
- A job-classifying and data-mining approach for estimating job cycle time in a wafer fabrication factory
- (2011) Toly Chen INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
- Job cycle time estimation in a wafer fabrication factory with a bi-directional classifying fuzzy-neural approach
- (2011) Toly Chen INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
- Manufacturing intelligence to forecast and reduce semiconductor cycle time
- (2011) Chen-Fu Chien et al. JOURNAL OF INTELLIGENT MANUFACTURING
- Predicting the development cost of TFT-LCD manufacturing equipment with artificial intelligence models
- (2010) Jui-Sheng Chou et al. INTERNATIONAL JOURNAL OF PRODUCTION ECONOMICS
- Manufacturing intelligence for semiconductor demand forecast based on technology diffusion and product life cycle
- (2010) Chen-Fu Chien et al. INTERNATIONAL JOURNAL OF PRODUCTION ECONOMICS
- Intelligent scheduling approaches for a wafer fabrication factory
- (2010) Toly Chen JOURNAL OF INTELLIGENT MANUFACTURING
- Rule-based data mining for yield improvement in semiconductor manufacturing
- (2009) Sholom M. Weiss et al. APPLIED INTELLIGENCE
- Fuzzy-neural approaches with example post-classification for estimating job cycle time in a wafer fab
- (2009) Toly Chen et al. APPLIED SOFT COMPUTING
- Quality-oriented optimization of wave soldering process by using self-organizing maps
- (2009) Mika Liukkonen et al. APPLIED SOFT COMPUTING
- Modelling and optimization of fluid dispensing for electronic packaging using neural fuzzy networks and genetic algorithms
- (2009) K.Y. Chan et al. ENGINEERING APPLICATIONS OF ARTIFICIAL INTELLIGENCE
- A virtual metrology system for semiconductor manufacturing
- (2009) Pilsung Kang et al. EXPERT SYSTEMS WITH APPLICATIONS
- Modeling of Soldering Quality by Using Artificial Neural Networks
- (2009) M. Liukkonen et al. IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING
- A nonlinear scheduling rule incorporating fuzzy-neural remaining cycle time estimator for scheduling a semiconductor manufacturing factory—a simulation study
- (2009) Toly Chen et al. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
- A bi-criteria nonlinear fluctuation smoothing rule incorporating the SOM–FBPN remaining cycle time estimator for scheduling a wafer fab—a simulation study
- (2009) Toly Chen et al. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
- Estimating printed circuit board assembly times using neural networks
- (2009) Frans Vainio et al. INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
- Data clustering and fuzzy neural network for sales forecasting: A case study in printed circuit board industry
- (2009) Pei-Chann Chang et al. KNOWLEDGE-BASED SYSTEMS
- Dynamic fuzzy-neural fluctuation smoothing rule for jobs scheduling in a wafer fabrication factory
- (2009) T Chen PROCEEDINGS OF THE INSTITUTION OF MECHANICAL ENGINEERS PART I-JOURNAL OF SYSTEMS AND CONTROL ENGINEERING
- Incorporating the FCM–BPN approach with nonlinear programming for internal due date assignment in a wafer fabrication plant
- (2009) Toly Chen et al. ROBOTICS AND COMPUTER-INTEGRATED MANUFACTURING
- A fuzzy back propagation network ensemble with example classification for lot output time prediction in a wafer fab
- (2008) Toly Chen et al. APPLIED SOFT COMPUTING
- Application of data mining techniques in customer relationship management: A literature review and classification
- (2008) E.W.T. Ngai et al. EXPERT SYSTEMS WITH APPLICATIONS
- Stencil Printing Process Modeling and Control Using Statistical Neural Networks
- (2008) Leandro G. Barajas et al. IEEE TRANSACTIONS ON ELECTRONICS PACKAGING MANUFACTURING
- Lot cycle time prediction in a ramping-up semiconductor manufacturing factory with a SOM–FBPN-ensemble approach with multiple buckets and partial normalization
- (2008) Toly Chen et al. INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
- Data-mining-based dynamic dispatching rule selection mechanism for shop floor control systems using a support vector machine approach
- (2008) Yeou-Ren Shiue INTERNATIONAL JOURNAL OF PRODUCTION RESEARCH
- A FUZZY-NEURAL SYSTEM INCORPORATING UNEQUALLY IMPORTANT EXPERT OPINIONS FOR SEMICONDUCTOR YIELD FORECASTING
- (2008) TOLY CHEN et al. INTERNATIONAL JOURNAL OF UNCERTAINTY FUZZINESS AND KNOWLEDGE-BASED SYSTEMS
- Data mining in manufacturing: a review based on the kind of knowledge
- (2008) A. K. Choudhary et al. JOURNAL OF INTELLIGENT MANUFACTURING
- An intelligent mechanism for lot output time prediction and achievability evaluation in a wafer fab
- (2007) Toly Chen COMPUTERS & INDUSTRIAL ENGINEERING
- Data mining approaches for modeling complex electronic circuit design activities
- (2007) Yongjin Kwon et al. COMPUTERS & INDUSTRIAL ENGINEERING
- A fuzzy case-based reasoning model for sales forecasting in print circuit board industries
- (2007) Pei-Chann Chang et al. EXPERT SYSTEMS WITH APPLICATIONS
Publish scientific posters with Peeref
Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.
Learn MoreCreate your own webinar
Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.
Create Now