In situ investigation of nanometric cutting of 3C-SiC using scanning electron microscope
出版年份 2021 全文链接
标题
In situ investigation of nanometric cutting of 3C-SiC using scanning electron microscope
作者
关键词
-
出版物
INTERNATIONAL JOURNAL OF ADVANCED MANUFACTURING TECHNOLOGY
Volume 115, Issue 7-8, Pages 2299-2312
出版商
Springer Science and Business Media LLC
发表日期
2021-05-23
DOI
10.1007/s00170-021-07278-x
参考文献
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