In Quest of Nonfilamentary Switching: A Synergistic Approach of Dual Nanostructure Engineering to Improve the Variability and Reliability of Resistive Random‐Access‐Memory Devices
出版年份 2020 全文链接
标题
In Quest of Nonfilamentary Switching: A Synergistic Approach of Dual Nanostructure Engineering to Improve the Variability and Reliability of Resistive Random‐Access‐Memory Devices
作者
关键词
-
出版物
Advanced Electronic Materials
Volume -, Issue -, Pages 2000209
出版商
Wiley
发表日期
2020-05-07
DOI
10.1002/aelm.202000209
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