标题
QTL mapping for yield-related traits in wheat based on four RIL populations
作者
关键词
-
出版物
THEORETICAL AND APPLIED GENETICS
Volume 133, Issue 3, Pages 917-933
出版商
Springer Science and Business Media LLC
发表日期
2020-01-02
DOI
10.1007/s00122-019-03515-w
参考文献
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