QTL mapping for yield-related traits in wheat based on four RIL populations

Title
QTL mapping for yield-related traits in wheat based on four RIL populations
Authors
Keywords
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Journal
THEORETICAL AND APPLIED GENETICS
Volume 133, Issue 3, Pages 917-933
Publisher
Springer Science and Business Media LLC
Online
2020-01-02
DOI
10.1007/s00122-019-03515-w

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