Mapping of quantitative trait loci for grain yield and its components in a US popular winter wheat TAM 111 using 90K SNPs

标题
Mapping of quantitative trait loci for grain yield and its components in a US popular winter wheat TAM 111 using 90K SNPs
作者
关键词
Quantitative trait loci, Gene mapping, Leaves, Wheat, Epistasis, Chromosome mapping, Phenotypes, Heredity
出版物
PLoS One
Volume 12, Issue 12, Pages e0189669
出版商
Public Library of Science (PLoS)
发表日期
2017-12-22
DOI
10.1371/journal.pone.0189669

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