Interfacial Impurities and Their Electronic Signatures in High‐Voltage Regrown Nonpolar m‐ Plane GaN Vertical p–n Diodes

标题
Interfacial Impurities and Their Electronic Signatures in High‐Voltage Regrown Nonpolar m‐ Plane GaN Vertical p–n Diodes
作者
关键词
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出版物
出版商
Wiley
发表日期
2019-12-10
DOI
10.1002/pssa.201900757

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