Interfacial Impurities and Their Electronic Signatures in High‐Voltage Regrown Nonpolar m‐ Plane GaN Vertical p–n Diodes
出版年份 2019 全文链接
标题
Interfacial Impurities and Their Electronic Signatures in High‐Voltage Regrown Nonpolar
m‐
Plane GaN Vertical
p–n
Diodes
作者
关键词
-
出版物
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
Volume -, Issue -, Pages 1900757
出版商
Wiley
发表日期
2019-12-10
DOI
10.1002/pssa.201900757
参考文献
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