标题
Ferroelectricity in YO1.5-HfO2 films around 1 μm in thickness
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 115, Issue 3, Pages 032901
出版商
AIP Publishing
发表日期
2019-07-16
DOI
10.1063/1.5097880
参考文献
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注意:仅列出部分参考文献,下载原文获取全部文献信息。- Phase transformation behavior of ultrathin Hf0.5Zr0.5O2 films investigated through wide range annealing experiments
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