标题
Electron Bessel beam diffraction for precise and accurate nanoscale strain mapping
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 114, Issue 24, Pages 243501
出版商
AIP Publishing
发表日期
2019-06-18
DOI
10.1063/1.5096245
参考文献
相关参考文献
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