Improvement of bias stability of oxyanion-incorporated aqueous sol–gel processed indium zinc oxide TFTs

High Performance, Low Temperature Solution-Processed Barium and Strontium Doped Oxide Thin Film Transistors

(2013) Kulbinder K. Banger et al.   CHEMISTRY OF MATERIALS

Photo-bias instability of metal oxide thin film transistors for advanced active matrix displays

(2013) Jae Kyeong Jeong   JOURNAL OF MATERIALS RESEARCH

The Effect of Metal Composition on Bias Stability of Solution Processed Indium Oxide Based Thin Film Transistors

(2013) Young Hwan Hwang et al.   ECS Journal of Solid State Science and Technology

Improvement of the photo-bias stability of the Zn–Sn–O field effect transistors by an ozone treatment

(2012) Bong Seob Yang et al.   JOURNAL OF MATERIALS CHEMISTRY

Suppression in the negative bias illumination instability of Zn-Sn-O transistor using oxygen plasma treatment

(2011) Shinhyuk Yang et al.   APPLIED PHYSICS LETTERS

Effect of high-pressure oxygen annealing on negative bias illumination stress-induced instability of InGaZnO thin film transistors

(2011) Kwang Hwan Ji et al.   APPLIED PHYSICS LETTERS

Sulphur doped nanoparticles of TiO2

(2011) Lórant Szatmáry et al.   CATALYSIS TODAY

Bias stress stable aqueous solution derived Y-doped ZnO thin film transistors

(2011) Taehwan Jun et al.   JOURNAL OF MATERIALS CHEMISTRY

The status and perspectives of metal oxide thin-film transistors for active matrix flexible displays

(2011) Jae Kyeong Jeong   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Behaviors of InGaZnO thin film transistor under illuminated positive gate-bias stress

(2010) Te-Chih Chen et al.   APPLIED PHYSICS LETTERS

Instability in threshold voltage and subthreshold behavior in Hf–In–Zn–O thin film transistors induced by bias-and light-stress

(2010) Khashayar Ghaffarzadeh et al.   APPLIED PHYSICS LETTERS

Facile Synthesis of N- and S-Incorporated Nanocrystalline TiO2 and Direct Solar-Light-Driven Photocatalytic Activity

(2010) Brundabana Naik et al.   Journal of Physical Chemistry C

Present status of amorphous In–Ga–Zn–O thin-film transistors

(2010) Toshio Kamiya et al.   SCIENCE AND TECHNOLOGY OF ADVANCED MATERIALS

Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors

(2008) A. Suresh et al.   APPLIED PHYSICS LETTERS

The Effect of Gate-Bias Stress and Temperature on the Performance of ZnO Thin-Film Transistors

(2008) R.B.M. Cross et al.   IEEE TRANSACTIONS ON DEVICE AND MATERIALS RELIABILITY

Zn-In-O based thin-film transistors: Compositional dependence

(2008) N. Itagaki et al.   PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE