Bias stress stable aqueous solution derived Y-doped ZnO thin film transistors

Investigation of the effects of Mg incorporation into InZnO for high-performance and high-stability solution-processed thin film transistors

(2010) Gun Hee Kim et al.   APPLIED PHYSICS LETTERS

The effect of La in InZnO systems for solution-processed amorphous oxide thin-film transistors

(2010) Doo Na Kim et al.   APPLIED PHYSICS LETTERS

High-performance low-temperature solution-processable ZnO thin film transistors by microwave-assisted annealing

(2010) Taehwan Jun et al.   JOURNAL OF MATERIALS CHEMISTRY

Role of Gallium Doping in Dramatically Lowering Amorphous-Oxide Processing Temperatures for Solution-Derived Indium Zinc Oxide Thin-Film Transistors

(2009) Sunho Jeong et al.   ADVANCED MATERIALS

Impact of Sn/Zn ratio on the gate bias and temperature-induced instability of Zn-In-Sn-O thin film transistors

(2009) Min Ki Ryu et al.   APPLIED PHYSICS LETTERS

The influence of the gate dielectrics on threshold voltage instability in amorphous indium-gallium-zinc oxide thin film transistors

(2009) Jaeseob Lee et al.   APPLIED PHYSICS LETTERS

The effect of moisture on the photon-enhanced negative bias thermal instability in Ga–In–Zn–O thin film transistors

(2009) Kwang-Hee Lee et al.   APPLIED PHYSICS LETTERS

Constant-Voltage-Bias Stress Testing of a-IGZO Thin-Film Transistors

(2009) Ken Hoshino et al.   IEEE TRANSACTIONS ON ELECTRON DEVICES

Zinc oxide derived from single source precursor chemistry under chimie douce conditions: formation pathway, defect chemistry and possible applications in thin film printing

(2009) Jörg J. Schneider et al.   JOURNAL OF MATERIALS CHEMISTRY

Bias Stress Stability of Solution-Processed Zinc Tin Oxide Thin-Film Transistors

(2009) Youngmin Jeong et al.   JOURNAL OF THE ELECTROCHEMICAL SOCIETY

MATERIALS SCIENCE: Flexible Electronics

(2009) B. D. Gates   SCIENCE

Novel ZrInZnO Thin-film Transistor with Excellent Stability

(2008) Jin-Seong Park et al.   ADVANCED MATERIALS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

Stable ZnO thin film transistors by fast open air atomic layer deposition

(2008) David H. Levy et al.   APPLIED PHYSICS LETTERS

Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors

(2008) A. Suresh et al.   APPLIED PHYSICS LETTERS

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

(2008) Jeong-Min Lee et al.   APPLIED PHYSICS LETTERS

High mobility indium free amorphous oxide thin film transistors

(2008) Elvira M. C. Fortunato et al.   APPLIED PHYSICS LETTERS

Aqueous Inorganic Inks for Low-Temperature Fabrication of ZnO TFTs

(2008) Stephen T. Meyers et al.   JOURNAL OF THE AMERICAN CHEMICAL SOCIETY