In-situ X-ray Diffraction study of Metal Induced Crystallization of amorphous silicon

出版年份 2007 全文链接

标题

In-situ X-ray Diffraction study of Metal Induced Crystallization of amorphous silicon

作者

关键词

-

出版物

THIN SOLID FILMS

Volume 516, Issue 15, Pages 4946-4952

出版商

Elsevier BV

发表日期

2007-10-02

DOI

10.1016/j.tsf.2007.09.037

向作者/读者发起求助以获取更多资源

Protocol

Reagent

Reprint

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

© Peeref 2019-2024. All rights reserved.