Interface and bulk effects for bias—light-illumination instability in amorphous-In—Ga—Zn—O thin-film transistors
出版年份 2010 全文链接
标题
Interface and bulk effects for bias—light-illumination instability in amorphous-In—Ga—Zn—O thin-film transistors
作者
关键词
-
出版物
Journal of the Society for Information Display
Volume 18, Issue 10, Pages 789
出版商
Wiley
发表日期
2010-09-30
DOI
10.1889/jsid18.10.789
参考文献
相关参考文献
注意:仅列出部分参考文献,下载原文获取全部文献信息。- Origins of threshold voltage shifts in room-temperature deposited and annealed a-In–Ga–Zn–O thin-film transistors
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- The effect of moisture on the photon-enhanced negative bias thermal instability in Ga–In–Zn–O thin film transistors
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- Light Effects on the Bias Stability of Transparent ZnO Thin Film Transistors
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- Electrical Instability of RF Sputter Amorphous In-Ga-Zn-O Thin-Film Transistors
- (2009) Tze-Ching Fung et al. Journal of Display Technology
- 12.1-in. WXGA AMOLED display driven by InGaZnO thin-film transistors
- (2009) Jae Kyeong Jeong et al. Journal of the Society for Information Display
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- (2009) Toshio Kamiya et al. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
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- (2008) Kenji Nomura et al. APPLIED PHYSICS LETTERS
- Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors
- (2008) Jae Kyeong Jeong et al. APPLIED PHYSICS LETTERS
- Trap densities in amorphous-InGaZnO4 thin-film transistors
- (2008) Mutsumi Kimura et al. APPLIED PHYSICS LETTERS
- Bias stress stability of indium gallium zinc oxide channel based transparent thin film transistors
- (2008) A. Suresh et al. APPLIED PHYSICS LETTERS
- Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors
- (2008) Jeong-Min Lee et al. APPLIED PHYSICS LETTERS
- Thermal Analysis of Degradation in Ga2O3–In2O3–ZnO Thin-Film Transistors
- (2008) Mami Fujii et al. JAPANESE JOURNAL OF APPLIED PHYSICS
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