High-Resolution Genome-Wide Analysis of Irradiated (UV and  -Rays) Diploid Yeast Cells Reveals a High Frequency of Genomic Loss of Heterozygosity (LOH) Events

Title
High-Resolution Genome-Wide Analysis of Irradiated (UV and  -Rays) Diploid Yeast Cells Reveals a High Frequency of Genomic Loss of Heterozygosity (LOH) Events
Authors
Keywords
-
Journal
GENETICS
Volume 190, Issue 4, Pages 1267-1284
Publisher
Genetics Society of America
Online
2012-01-22
DOI
10.1534/genetics.111.137927

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