High-Resolution Genome-Wide Analysis of Irradiated (UV and  -Rays) Diploid Yeast Cells Reveals a High Frequency of Genomic Loss of Heterozygosity (LOH) Events

标题
High-Resolution Genome-Wide Analysis of Irradiated (UV and  -Rays) Diploid Yeast Cells Reveals a High Frequency of Genomic Loss of Heterozygosity (LOH) Events
作者
关键词
-
出版物
GENETICS
Volume 190, Issue 4, Pages 1267-1284
出版商
Genetics Society of America
发表日期
2012-01-22
DOI
10.1534/genetics.111.137927

向作者/读者发起求助以获取更多资源

Discover Peeref hubs

Discuss science. Find collaborators. Network.

Join a conversation

Become a Peeref-certified reviewer

The Peeref Institute provides free reviewer training that teaches the core competencies of the academic peer review process.

Get Started