Electrical behavior analysis of n-type CaCu3Ti4O12 thick films exposed to different atmospheres

Authors

Keywords

Semiconductor, Conduction mechanism, CaCu, 3, Ti, 4, O, 12, Diffusion

Journal

Volume 35, Issue 1, Pages 153-161

Publisher

Elsevier BV

Online

2014-09-12

DOI

10.1016/j.jeurceramsoc.2014.08.041

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