Grain boundary passivation studied by in situ scanning tunneling microscopy on microcrystalline copper

Title
Grain boundary passivation studied by in situ scanning tunneling microscopy on microcrystalline copper
Authors
Keywords
Corrosion, Passive film, Grain boundary, Copper, In situ, STM
Journal
JOURNAL OF SOLID STATE ELECTROCHEMISTRY
Volume 19, Issue 12, Pages 3501-3509
Publisher
Springer Nature
Online
2015-02-23
DOI
10.1007/s10008-015-2787-x

Ask authors/readers for more resources

Reprint

Contact the author

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search

Add your recorded webinar

Do you already have a recorded webinar? Grow your audience and get more views by easily listing your recording on Peeref.

Upload Now