Grain boundary passivation studied by in situ scanning tunneling microscopy on microcrystalline copper

标题
Grain boundary passivation studied by in situ scanning tunneling microscopy on microcrystalline copper
作者
关键词
Corrosion, Passive film, Grain boundary, Copper, In situ, STM
出版物
JOURNAL OF SOLID STATE ELECTROCHEMISTRY
Volume 19, Issue 12, Pages 3501-3509
出版商
Springer Nature
发表日期
2015-02-23
DOI
10.1007/s10008-015-2787-x

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