Fabrication of p-n junction diode using SnO/SnO2 thin films and its device characteristics

Published 2014 View Full Article

Authors

Keywords

SnO/SnO<sub>2</sub> diode, raman analysis, TEM, thermal evaporation

Journal

Electronic Materials Letters

Volume 10, Issue 4, Pages 743-747

Publisher

Springer Nature

Online

2014-08-01

DOI

10.1007/s13391-013-3297-6

References

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