Improved Bias Stability of Solution-Processed ZnSnO Thin-Film Transistors by Zr Addition

Investigating addition effect of hafnium in InZnO thin film transistors using a solution process

(2010) Woong Hee Jeong et al.   APPLIED PHYSICS LETTERS

Novel ZrInZnO Thin-film Transistor with Excellent Stability

(2008) Jin-Seong Park et al.   ADVANCED MATERIALS

Origin of threshold voltage instability in indium-gallium-zinc oxide thin film transistors

(2008) Jae Kyeong Jeong et al.   APPLIED PHYSICS LETTERS

Transparent Al–Zn–Sn–O thin film transistors prepared at low temperature

(2008) Doo-Hee Cho et al.   APPLIED PHYSICS LETTERS

Bias-stress-induced stretched-exponential time dependence of threshold voltage shift in InGaZnO thin film transistors

(2008) Jeong-Min Lee et al.   APPLIED PHYSICS LETTERS

High mobility indium free amorphous oxide thin film transistors

(2008) Elvira M. C. Fortunato et al.   APPLIED PHYSICS LETTERS

Effects of Substrate Heating and Film Thickness on Properties of Silver-Based ZnO Multilayer Thin Films

(2008) You-Seung Rim et al.   JAPANESE JOURNAL OF APPLIED PHYSICS

Electrical Modeling of Thin-Film Transistors

(2007) D. Hong et al.   CRITICAL REVIEWS IN SOLID STATE AND MATERIALS SCIENCES