Phase-sensitive specular neutron reflectometry for imaging the nanometer scale composition depth profile of thin-film materials

Published 2011 View Full Article

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Title
Phase-sensitive specular neutron reflectometry for imaging the nanometer scale composition depth profile of thin-film materials
Authors
Keywords
-
Journal
CURRENT OPINION IN COLLOID & INTERFACE SCIENCE
Volume 17, Issue 1, Pages 44-53
Publisher
Elsevier BV
Online
2011-11-22
DOI
10.1016/j.cocis.2011.11.001

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