Phase-sensitive specular neutron reflectometry for imaging the nanometer scale composition depth profile of thin-film materials

出版年份 2011 全文链接

标题

作者

关键词

出版物

Volume 17, Issue 1, Pages 44-53

出版商

Elsevier BV

发表日期

2011-11-22

DOI

10.1016/j.cocis.2011.11.001

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