Control of electrical properties and gate bias stress stability in solution-processed a-IZO TFTs by Zr doping

Title
Control of electrical properties and gate bias stress stability in solution-processed a-IZO TFTs by Zr doping
Authors
Keywords
-
Journal
CURRENT APPLIED PHYSICS
Volume 14, Issue 12, Pages 1831-1836
Publisher
Elsevier BV
Online
2014-10-30
DOI
10.1016/j.cap.2014.10.018

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