Control of electrical properties and gate bias stress stability in solution-processed a-IZO TFTs by Zr doping

标题
Control of electrical properties and gate bias stress stability in solution-processed a-IZO TFTs by Zr doping
作者
关键词
-
出版物
CURRENT APPLIED PHYSICS
Volume 14, Issue 12, Pages 1831-1836
出版商
Elsevier BV
发表日期
2014-10-30
DOI
10.1016/j.cap.2014.10.018

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