Revisiting the Twin Plane Re-entrant Edge Growth Mechanism at an Atomic Scale by Electron Microscopy

Title
Revisiting the Twin Plane Re-entrant Edge Growth Mechanism at an Atomic Scale by Electron Microscopy
Authors
Keywords
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Journal
CRYSTAL GROWTH & DESIGN
Volume 14, Issue 9, Pages 4411-4417
Publisher
American Chemical Society (ACS)
Online
2014-07-29
DOI
10.1021/cg500514c

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