Development of Silicon Probe With Acute Study on In Vivo Neural Recording and Implantation Behavior Monitored by Integrated Si-Nanowire Strain Sensors

Published 2015 View Full Article

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Title
Development of Silicon Probe With Acute Study on In Vivo Neural Recording and Implantation Behavior Monitored by Integrated Si-Nanowire Strain Sensors
Authors
Keywords
-
Journal
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS
Volume 24, Issue 5, Pages 1303-1313
Publisher
Institute of Electrical and Electronics Engineers (IEEE)
Online
2015-04-15
DOI
10.1109/jmems.2015.2417678

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