Development of Silicon Probe With Acute Study on In Vivo Neural Recording and Implantation Behavior Monitored by Integrated Si-Nanowire Strain Sensors

标题
Development of Silicon Probe With Acute Study on In Vivo Neural Recording and Implantation Behavior Monitored by Integrated Si-Nanowire Strain Sensors
作者
关键词
-
出版物
JOURNAL OF MICROELECTROMECHANICAL SYSTEMS
Volume 24, Issue 5, Pages 1303-1313
出版商
Institute of Electrical and Electronics Engineers (IEEE)
发表日期
2015-04-15
DOI
10.1109/jmems.2015.2417678

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