On the pressing need to address beam–sample interactions in atomic resolution electron microscopy

Observing gas-catalyst dynamics at atomic resolution and single-atom sensitivity

(2015) S. Helveg et al.   MICRON

Preface

(2015) G.A. Botton et al.   MICRON

Instrumental requirements for the detection of electron beam-induced object excitations at the single atom level in high-resolution transmission electron microscopy

(2015) C. Kisielowski et al.   MICRON

The revolution will not be crystallized: a new method sweeps through structural biology

(2015) Ewen Callaway   NATURE

Three-dimensional coordinates of individual atoms in materials revealed by electron tomography

(2015) Rui Xu et al.   NATURE MATERIALS

Advances in the environmental transmission electron microscope (ETEM) for nanoscale in situ studies of gas–solid interactions

(2014) J. R. Jinschek   CHEMICAL COMMUNICATIONS

Atomic surface diffusion on Pt nanoparticles quantified by high-resolution transmission electron microscopy

(2014) S. Schneider et al.   MICRON

Solar energy: Springtime for the artificial leaf

(2014) Jessica Marshall   NATURE

The birth of a new field

(2014) J. C. H. Spence et al.   PHILOSOPHICAL TRANSACTIONS OF THE ROYAL SOCIETY B-BIOLOGICAL SCIENCES

Trajectories of the ribosome as a Brownian nanomachine

(2014) Ali Dashti et al.   PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA

Real-time sub-Ångstrom imaging of reversible and irreversible conformations in rhodium catalysts and graphene

(2013) Christian Kisielowski et al.   PHYSICAL REVIEW B

Thermal Magnetic Field Noise Limits Resolution in Transmission Electron Microscopy

(2013) Stephan Uhlemann et al.   PHYSICAL REVIEW LETTERS

The potential for Bayesian compressive sensing to significantly reduce electron dose in high-resolution STEM images

(2013) Andrew Stevens et al.   Microscopy

4D Electron Microscopy: Principles and Applications

(2012) David J. Flannigan et al.   ACCOUNTS OF CHEMICAL RESEARCH

Information Transfer in a TEM Corrected for Spherical and Chromatic Aberration

(2010) M. Haider et al.   MICROSCOPY AND MICROANALYSIS

Atomic-Resolution Imaging with a Sub-50-pm Electron Probe

(2009) Rolf Erni et al.   PHYSICAL REVIEW LETTERS

Detection of Single Atoms and Buried Defects in Three Dimensions by Aberration-Corrected Electron Microscope with 0.5-Å Information Limit

(2008) C. Kisielowski et al.   MICROSCOPY AND MICROANALYSIS

Imaging of Transient Structures Using Nanosecond in Situ TEM

(2008) Judy S. Kim et al.   SCIENCE