Band Alignment and Band Gap Characterization of La2O3Films on Si Substrates Grown by Radio Frequency Magnetron Sputtering

Published 2014 View Full Article

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Title
Band Alignment and Band Gap Characterization of La2O3Films on Si Substrates Grown by Radio Frequency Magnetron Sputtering
Authors
Keywords
-
Journal
CHINESE PHYSICS LETTERS
Volume 31, Issue 2, Pages 027702
Publisher
IOP Publishing
Online
2014-02-06
DOI
10.1088/0256-307x/31/2/027702

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