Band Alignment and Band Gap Characterization of La2O3Films on Si Substrates Grown by Radio Frequency Magnetron Sputtering

标题
Band Alignment and Band Gap Characterization of La2O3Films on Si Substrates Grown by Radio Frequency Magnetron Sputtering
作者
关键词
-
出版物
CHINESE PHYSICS LETTERS
Volume 31, Issue 2, Pages 027702
出版商
IOP Publishing
发表日期
2014-02-06
DOI
10.1088/0256-307x/31/2/027702

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