Characterization Method of Polycrystalline Materials Using Conductive Atomic Force Microscopy

Published 2008 View Full Article

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Title
Characterization Method of Polycrystalline Materials Using Conductive Atomic Force Microscopy
Authors
Keywords
-
Journal
CHINESE PHYSICS LETTERS
Volume 25, Issue 10, Pages 3597-3600
Publisher
IOP Publishing
Online
2008-10-04
DOI
10.1088/0256-307x/25/10/021

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