Characterization Method of Polycrystalline Materials Using Conductive Atomic Force Microscopy

标题
Characterization Method of Polycrystalline Materials Using Conductive Atomic Force Microscopy
作者
关键词
-
出版物
CHINESE PHYSICS LETTERS
Volume 25, Issue 10, Pages 3597-3600
出版商
IOP Publishing
发表日期
2008-10-04
DOI
10.1088/0256-307x/25/10/021

向作者/读者发起求助以获取更多资源

Publish scientific posters with Peeref

Peeref publishes scientific posters from all research disciplines. Our Diamond Open Access policy means free access to content and no publication fees for authors.

Learn More

Find the ideal target journal for your manuscript

Explore over 38,000 international journals covering a vast array of academic fields.

Search