Ion Dependence of Gate Dielectric Behavior of Alkali Metal Ion-Incorporated Aluminas in Oxide Field-Effect Transistors

Published 2013 View Full Article

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Title
Ion Dependence of Gate Dielectric Behavior of Alkali Metal Ion-Incorporated Aluminas in Oxide Field-Effect Transistors
Authors
Keywords
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Journal
CHEMISTRY OF MATERIALS
Volume 25, Issue 19, Pages 3788-3796
Publisher
American Chemical Society (ACS)
Online
2013-09-02
DOI
10.1021/cm4012537

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