Ion Dependence of Gate Dielectric Behavior of Alkali Metal Ion-Incorporated Aluminas in Oxide Field-Effect Transistors

出版年份 2013 全文链接

标题

作者

关键词

出版物

Volume 25, Issue 19, Pages 3788-3796

出版商

American Chemical Society (ACS)

发表日期

2013-09-02

DOI

10.1021/cm4012537

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