Spectroscopic ellipsometry study of the free-carrier and band-edge absorption in ZnO thin films: Effect of non-stoichiometry

Title
Spectroscopic ellipsometry study of the free-carrier and band-edge absorption in ZnO thin films: Effect of non-stoichiometry
Authors
Keywords
-
Journal
JOURNAL OF APPLIED PHYSICS
Volume 118, Issue 19, Pages 195305
Publisher
AIP Publishing
Online
2015-11-20
DOI
10.1063/1.4935629

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