Modelling and experimental verification of tip-induced polarization in Kelvin probe force microscopy measurements on dielectric surfaces

Electronic characterization of supramolecular materials at the nanoscale by Conductive Atomic Force and Kelvin Probe Force microscopies

(2014) Chiara Musumeci et al.   Materials Today

Reconstruction of surface potential from Kelvin probe force microscopy images

(2013) G Cohen et al.   NANOTECHNOLOGY

Electric field concentration in the vicinity of the interface between anode and degraded BaTiO3-based ceramics in multilayer ceramic capacitor

(2011) Takafumi Okamoto et al.   APPLIED PHYSICS LETTERS

The role of the cantilever in Kelvin probe force microscopy measurements

(2011) George Elias et al.   Beilstein Journal of Nanotechnology

Recent Trends in Surface Characterization and Chemistry with High-Resolution Scanning Force Methods

(2010) Clemens Barth et al.   ADVANCED MATERIALS

Kelvin probe force microscopy and its application

(2010) Wilhelm Melitz et al.   SURFACE SCIENCE REPORTS

Kelvin Probe Force Microscopy on MgO(001) Surfaces and Supported Pd Nanoclusters

(2009) Clemens Barth et al.   Journal of Physical Chemistry C

Quantitative dopant profiling in semiconductors: A Kelvin probe force microscopy model

(2009) C. Baumgart et al.   PHYSICAL REVIEW B

Cationic Disorder and Phase Segregation inLaAlO3/SrTiO3Heterointerfaces Evidenced by Medium-Energy Ion Spectroscopy

(2009) A. S. Kalabukhov et al.   PHYSICAL REVIEW LETTERS

Atomic and subnanometer resolution in ambient conditions by atomic force microscopy

(2009) Yang Gan   SURFACE SCIENCE REPORTS

Surface potential images of polycrystalline organic semiconductors obtained by Kelvin probe force microscopy

(2008) Haichao Huang et al.   APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING

Advances in AFM for the electrical characterization of semiconductors

(2008) Rachel A Oliver   REPORTS ON PROGRESS IN PHYSICS