Atomic and subnanometer resolution in ambient conditions by atomic force microscopy

Title
Atomic and subnanometer resolution in ambient conditions by atomic force microscopy
Authors
Keywords
-
Journal
SURFACE SCIENCE REPORTS
Volume 64, Issue 3, Pages 99-121
Publisher
Elsevier BV
Online
2009-01-20
DOI
10.1016/j.surfrep.2008.12.001

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