Degradation of (InAlGa)N-based UV-B light emitting diodes stressed by current and temperature

Diffusion of Mg dopant in metal-organic vapor-phase epitaxy grown GaN and AlxGa1−xN

(2013) K. Köhler et al.   JOURNAL OF APPLIED PHYSICS

Electrical properties and microstructure of vanadium-based contacts on ICP plasma etched n-type AlGaN:Si and GaN:Si surfaces

(2013) Mickael Lapeyrade et al.   SEMICONDUCTOR SCIENCE AND TECHNOLOGY

Diffusion and Stability of Hydrogen in Mg-Doped GaN: A Density Functional Study

(2012) Ji-Sang Park et al.   Applied Physics Express

Transport-mechanism analysis of the reverse leakage current in GaInN light-emitting diodes

(2011) Qifeng Shan et al.   APPLIED PHYSICS LETTERS

High current-induced degradation of AlGaN ultraviolet light emitting diodes

(2011) A. Pinos et al.   JOURNAL OF APPLIED PHYSICS

Hot-electron induced degradations in GaN-based LEDs fabricated on nanoscale epitaxial lateral overgrown layers

(2011) Z.W. Zhang et al.   SOLID-STATE ELECTRONICS

Analysis of the physical processes responsible for the degradation of deep-ultraviolet light emitting diodes

(2010) Matteo Meneghini et al.   APPLIED PHYSICS LETTERS

Current-induced degradation of high performance deep ultraviolet light emitting diodes

(2010) Craig G. Moe et al.   APPLIED PHYSICS LETTERS

Defect-related degradation of Deep-UV-LEDs

(2010) M. Meneghini et al.   MICROELECTRONICS RELIABILITY

High-current Electro-optical Degradation of InGaN/GaNLight-emitting Diodes Fabricated with Ag-based Reflectors

(2009) Seong-Min Moon et al.   JOURNAL OF THE KOREAN PHYSICAL SOCIETY

Degradation of AlGaN-based ultraviolet light emitting diodes

(2008) S. Sawyer et al.   SOLID-STATE ELECTRONICS