XPS analysis and structural and morphological characterization of Cu2ZnSnS4 thin films grown by sequential evaporation

Published 2014 View Full Article

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Title
XPS analysis and structural and morphological characterization of Cu2ZnSnS4 thin films grown by sequential evaporation
Authors
Keywords
-
Journal
APPLIED SURFACE SCIENCE
Volume 305, Issue -, Pages 506-514
Publisher
Elsevier BV
Online
2014-03-27
DOI
10.1016/j.apsusc.2014.03.124

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