XPS analysis and structural and morphological characterization of Cu2ZnSnS4 thin films grown by sequential evaporation

标题
XPS analysis and structural and morphological characterization of Cu2ZnSnS4 thin films grown by sequential evaporation
作者
关键词
-
出版物
APPLIED SURFACE SCIENCE
Volume 305, Issue -, Pages 506-514
出版商
Elsevier BV
发表日期
2014-03-27
DOI
10.1016/j.apsusc.2014.03.124

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