Influence of postdeposition annealing on structural properties and electrical characteristics of thin Tm2O3 and Tm2Ti2O7 dielectrics

Published 2009 View Full Article

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Title
Influence of postdeposition annealing on structural properties and electrical characteristics of thin Tm2O3 and Tm2Ti2O7 dielectrics
Authors
Keywords
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Journal
APPLIED SURFACE SCIENCE
Volume 256, Issue 9, Pages 2786-2791
Publisher
Elsevier BV
Online
2009-11-14
DOI
10.1016/j.apsusc.2009.11.029

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