AFM–IR: Combining Atomic Force Microscopy and Infrared Spectroscopy for Nanoscale Chemical Characterization
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Title
AFM–IR: Combining Atomic Force Microscopy and Infrared Spectroscopy for Nanoscale Chemical Characterization
Authors
Keywords
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Journal
APPLIED SPECTROSCOPY
Volume 66, Issue 12, Pages 1365-1384
Publisher
SAGE Publications
Online
2012-12-11
DOI
10.1366/12-06804
References
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