Enhanced memory effect via quantum confinement in 16 nm InN nanoparticles embedded in ZnO charge trapping layer

Title
Enhanced memory effect via quantum confinement in 16 nm InN nanoparticles embedded in ZnO charge trapping layer
Authors
Keywords
-
Journal
APPLIED PHYSICS LETTERS
Volume 104, Issue 25, Pages 253106
Publisher
AIP Publishing
Online
2014-06-26
DOI
10.1063/1.4885397

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