Specific methodology for capacitance imaging by atomic force microscopy: A breakthrough towards an elimination of parasitic effects

Published 2014 View Full Article

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Title
Specific methodology for capacitance imaging by atomic force microscopy: A breakthrough towards an elimination of parasitic effects
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 104, Issue 8, Pages 083108
Publisher
AIP Publishing
Online
2014-02-26
DOI
10.1063/1.4866607
References
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