Specific methodology for capacitance imaging by atomic force microscopy: A breakthrough towards an elimination of parasitic effects

标题
Specific methodology for capacitance imaging by atomic force microscopy: A breakthrough towards an elimination of parasitic effects
作者
关键词
-
出版物
APPLIED PHYSICS LETTERS
Volume 104, Issue 8, Pages 083108
出版商
AIP Publishing
发表日期
2014-02-26
DOI
10.1063/1.4866607

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