Determination of Schottky barrier profile at Pt/SrTiO3:Nb junction by x-ray photoemission

Observation and simulation of hard x ray photoelectron diffraction to determine polarity of polycrystalline zinc oxide films with rotation domains

(2012) Jesse R. Williams et al.   JOURNAL OF APPLIED PHYSICS

Defects in ZnO transparent conductors studied by capacitance transients at ZnO/Si interface

(2011) Baoe Li et al.   APPLIED PHYSICS LETTERS

XPS study of Sb-/In-doping and surface pinning effects on the Fermi level in SnO2 (101) thin films

(2011) T. Nagata et al.   APPLIED PHYSICS LETTERS

Temperature dependence of carrier transport and resistance switching inPt/SrTi1−xNbxO3Schottky junctions

(2011) Jianyong Li et al.   PHYSICAL REVIEW B

Hard X-ray photoemission spectroscopy

(2009) Keisuke Kobayashi   NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT

Photoresponse of the Schottky junction Au/SrTiO3:Nb in different resistive states

(2008) D. S. Shang et al.   APPLIED PHYSICS LETTERS

Electrode-dependent electrical properties of metal/Nb-doped SrTiO3 junctions

(2008) C. Park et al.   JOURNAL OF APPLIED PHYSICS

Barrier height at(Ba,Sr)TiO3/Ptinterfaces studied by photoemission

(2008) R. Schafranek et al.   PHYSICAL REVIEW B