Defects in ZnO transparent conductors studied by capacitance transients at ZnO/Si interface

Authors

Keywords

Journal

Volume 98, Issue 8, Pages 082101

Publisher

AIP Publishing

Online

2011-02-23

DOI

10.1063/1.3556440

References

View 5 related references

Explore over 38,000 international journals covering a vast array of academic fields.

Interested in hosting your own webinar? Check the schedule and propose your idea to the Peeref Content Team.

Create Now