4.6 Article

Inserting a p-InGaN layer before the p-AlGaN electron blocking layer suppresses efficiency droop in InGaN-based light-emitting diodes

Journal

APPLIED PHYSICS LETTERS
Volume 101, Issue 8, Pages -

Publisher

AMER INST PHYSICS
DOI: 10.1063/1.4747802

Keywords

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Funding

  1. National Science Council of Taiwan [NSC 99-2221-E-182-040]

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In this study, we observed a dramatic decrease in the efficiency droop of InGaN/GaN light-emitting diodes after positioning a p-InGaN insertion layer before the p-AlGaN electron-blocking layer. The saturated external quantum efficiency of this device extended to 316 mA, with an efficiency droop of only 7% upon increasing the operating current to 1 A; in contrast, the corresponding conventional light-emitting diode suffered a severe efficiency droop of 42%. We suspect that the asymmetric carrier distribution was effectively mitigated as a result of an improvement in the hole injection rate and a suppression of electron overflow. (C) 2012 American Institute of Physics. [http://dx.doi.org/10.1063/1.4747802]

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