Impact of gate work-function on memory characteristics in Al2O3/HfOx/Al2O3/graphene charge-trap memory devices
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Title
Impact of gate work-function on memory characteristics in Al2O3/HfOx/Al2O3/graphene charge-trap memory devices
Authors
Keywords
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Journal
APPLIED PHYSICS LETTERS
Volume 100, Issue 2, Pages 023109
Publisher
AIP Publishing
Online
2012-01-11
DOI
10.1063/1.3675633
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